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"Compact test sets for high defect coverage."

Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara (1997)

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DOI: 10.1109/43.644620

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara:
Compact test sets for high defect coverage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(8): 923-930 (1997)

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