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"Testing of scan circuits containing nonisolated random-logic legacycores."

Irith Pomeranz, Y. Zonan (2001)

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DOI: 10.1109/43.936379

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Y. Zonan:
Testing of scan circuits containing nonisolated random-logic legacycores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(8): 980-993 (2001)

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