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"Design-for-testability for path delay faults in large combinational ..."

Irith Pomeranz, Sudhakar M. Reddy (1998)

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DOI: 10.1109/43.703823

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
Design-for-testability for path delay faults in large combinational circuits using test points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(4): 333-343 (1998)

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