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"Storage-Based Built-In Self-Test for Gate-Exhaustive Faults."

Irith Pomeranz (2021)

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DOI: 10.1109/TCAD.2020.3035133

access: closed

type: Journal Article

metadata version: 2021-10-05

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Irith Pomeranz:
Storage-Based Built-In Self-Test for Gate-Exhaustive Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(10): 2189-2193 (2021)

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