"Single-probe traversal optimization for testing of MCM substrate ..."

Rajesh Pendurkar, Craig A. Tovey, Abhijit Chatterjee (1999)

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DOI: 10.1109/43.775636

access: closed

type: Journal Article

metadata version: 2020-09-24

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Rajesh Pendurkar, Craig A. Tovey, Abhijit Chatterjee:
Single-probe traversal optimization for testing of MCM substrate interconnections. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(8): 1178-1191 (1999)

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