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"Negative Bias Temperature Instability: Estimation and Design for Improved ..."

Bipul Chandra Paul et al. (2007)

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DOI: 10.1109/TCAD.2006.884870

access: closed

type: Journal Article

metadata version: 2020-09-24

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Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy:
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(4): 743-751 (2007)

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