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"Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D ..."

Brandon Noia et al. (2011)

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DOI: 10.1109/TCAD.2011.2160177

access: closed

type: Journal Article

metadata version: 2024-02-05

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Brandon Noia, Krishnendu Chakrabarty, Sandeep Kumar Goel, Erik Jan Marinissen, Jouke Verbree:
Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D Stacked ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(11): 1705-1718 (2011)

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