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"The complexity of fault detection in MOS VLSI circuits."

Farid N. Najm, Ibrahim N. Hajj (1990)

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DOI: 10.1109/43.59075

access: closed

type: Journal Article

metadata version: 2020-09-24

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Farid N. Najm, Ibrahim N. Hajj:
The complexity of fault detection in MOS VLSI circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(9): 995-1001 (1990)

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