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"Highly Reliable Memory Architecture Using Adaptive Combination of ..."

Gian Mayuga, Yasuo Sato, Michiko Inoue (2020)

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DOI: 10.1109/TCAD.2019.2925365

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/MayugaSI20
Gian Mayuga, Yasuo Sato, Michiko Inoue:
Highly Reliable Memory Architecture Using Adaptive Combination of Proactive Aging-Aware In-Field Self-Repair and ECC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(8): 1688-1698 (2020)

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