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"Combining multiple DFT schemes with test generation."

Ben Mathew, Daniel G. Saab (1999)

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DOI: 10.1109/43.766721

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ben Mathew, Daniel G. Saab:
Combining multiple DFT schemes with test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(6): 685-696 (1999)

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