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"VLSI Yield Prediction and Estimation: A Unified Framework."

Wojciech Maly, Andrzej J. Strojwas, Stephen W. Director (1986)

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DOI: 10.1109/TCAD.1986.1270182

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/MalySD86
Wojciech Maly, Andrzej J. Strojwas, Stephen W. Director:
VLSI Yield Prediction and Estimation: A Unified Framework. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(1): 114-130 (1986)

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