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"Design Framework to Overcome Aging Degradation of the 16 nm VLSI ..."

Mohamed Mounir Mahmoud, Norhayati Soin, Hossam A. H. Fahmy (2014)

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DOI: 10.1109/TCAD.2014.2299713

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/tcad/MahmoudSF14
Mohamed Mounir Mahmoud, Norhayati Soin, Hossam A. H. Fahmy:
Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(5): 691-703 (2014)

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