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"Test generation for sequential circuits."

Hi-Keung Tony Ma et al. (1988)

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DOI: 10.1109/43.7807

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/MaDNS88
Hi-Keung Tony Ma, Srinivas Devadas, A. Richard Newton, Alberto L. Sangiovanni-Vincentelli:
Test generation for sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(10): 1081-1093 (1988)

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