"Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs."

Chien-Mo James Li, Edward J. McCluskey (2005)

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DOI: 10.1109/TCAD.2005.852457

access: closed

type: Journal Article

metadata version: 2020-09-24

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Chien-Mo James Li, Edward J. McCluskey:
Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(11): 1748-1759 (2005)

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