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"Design for test using partial parallel scan."

Sunggu Lee, Kang G. Shin (1990)

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DOI: 10.1109/43.46787

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sunggu Lee, Kang G. Shin:
Design for test using partial parallel scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(2): 203-211 (1990)

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