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"SWiTEST: a switch level test generation system for CMOS combinational ..."

Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer (1994)

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DOI: 10.1109/43.277636

access: closed

type: Journal Article

metadata version: 2020-09-24

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Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer:
SWiTEST: a switch level test generation system for CMOS combinational circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(5): 625-637 (1994)

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