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"Efficient Overdetection Elimination of Acceptable Faults for Yield ..."

Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer (2012)

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DOI: 10.1109/TCAD.2011.2179036

access: closed

type: Journal Article

metadata version: 2020-09-24

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Kuen-Jong Lee, Tong-Yu Hsieh, Melvin A. Breuer:
Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(5): 754-764 (2012)

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