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"Delay fault coverage, test set size, and performance trade-offs."
William K. C. Lam et al. (1995)
- William K. C. Lam, Alexander Saldanha, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli
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Delay fault coverage, test set size, and performance trade-offs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(1): 32-44 (1995)
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