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"Rapid method to account for process variation in full-chip capacitance ..."

Andrew Labun (2004)

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DOI: 10.1109/TCAD.2004.828111

access: closed

type: Journal Article

metadata version: 2020-09-24

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Andrew Labun:
Rapid method to account for process variation in full-chip capacitance extraction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(6): 941-951 (2004)

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