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"Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models ..."

Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy (2020)

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DOI: 10.1109/TCAD.2019.2921345

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/KungLR20
Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy:
Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(6): 1340-1345 (2020)

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