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"A normalized-area measure for VLSI layouts."

Musaravakkam S. Krishnan, John P. Hayes (1988)

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DOI: 10.1109/43.3174

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/KrishnanH88
Musaravakkam S. Krishnan, John P. Hayes:
A normalized-area measure for VLSI layouts. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(3): 411-419 (1988)

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