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"Methods to improve digital MOS macromodel accuracy."

Jeong-Taek Kong, David Overhauser (1995)

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DOI: 10.1109/43.391734

access: closed

type: Journal Article

metadata version: 2020-09-24

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Jeong-Taek Kong, David Overhauser:
Methods to improve digital MOS macromodel accuracy. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(7): 868-881 (1995)

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