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"A coordinated circuit partitioning and test generation method for ..."

Wen-Ben Jone, Christos A. Papachristou (1995)

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DOI: 10.1109/43.365128

access: closed

type: Journal Article

metadata version: 2020-09-24

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Wen-Ben Jone, Christos A. Papachristou:
A coordinated circuit partitioning and test generation method for pseudo-exhaustive testing of VLSI circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(3): 374-384 (1995)

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