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"Test pattern generation for circuits with tri-state modules by Z-algorithm."

Noriyoshi Itazaki, Kozo Kinoshita (1989)

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DOI: 10.1109/43.44513

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/ItazakiK89
Noriyoshi Itazaki, Kozo Kinoshita:
Test pattern generation for circuits with tri-state modules by Z-algorithm. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(12): 1327-1334 (1989)

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