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"Derivation and Refinement of Fan-Out Constraints to Generate Tests in ..."

Ki Soo Hwang, M. Ray Mercer (1986)

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DOI: 10.1109/TCAD.1986.1270227

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ki Soo Hwang, M. Ray Mercer:
Derivation and Refinement of Fan-Out Constraints to Generate Tests in Combinational Logic Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(4): 564-572 (1986)

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