Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Diagnosis of clustered faults and wafer testing."

Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thulasiraman (1998)

> Home

Details and statistics

DOI: 10.1109/43.681263

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/HuangAT98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/HuangAT98
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thulasiraman:
Diagnosis of clustered faults and wafer testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(2): 136-148 (1998)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.