Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Defect-Oriented Test: Effectiveness in High Volume Manufacturing."

Friedrich Hapke et al. (2021)

> Home

Details and statistics

DOI: 10.1109/TCAD.2020.3001259

access: open

type: Journal Article

metadata version: 2023-07-27

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/tcad/HapkeHMBVDGFR21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/HapkeHMBVDGFR21
Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski:
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 584-597 (2021)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.