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"A BIST scheme for RTL circuits based on symbolic testabilityanalysis."

Indradeep Ghosh, Niraj K. Jha, Sudipta Bhawmik (2000)

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DOI: 10.1109/43.822624

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - journals/tcad/GhoshJB00
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  - https://dblp.org/rec/journals/tcad/GhoshJB00
Indradeep Ghosh, Niraj K. Jha, Sudipta Bhawmik:
A BIST scheme for RTL circuits based on symbolic testabilityanalysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(1): 111-128 (2000)

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