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"Test generation and verification for highly sequential circuits."

Abhijit Ghosh, Srinivas Devadas, A. Richard Newton (1991)

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DOI: 10.1109/43.79502

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/GhoshDN91
Abhijit Ghosh, Srinivas Devadas, A. Richard Newton:
Test generation and verification for highly sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(5): 652-667 (1991)

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