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"A fast and low-cost testing technique for core-based system-chips."

Indradeep Ghosh, Sujit Dey, Niraj K. Jha (2000)

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DOI: 10.1109/43.856974

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - journals/tcad/GhoshDJ00
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  - https://dblp.org/rec/journals/tcad/GhoshDJ00
Indradeep Ghosh, Sujit Dey, Niraj K. Jha:
A fast and low-cost testing technique for core-based system-chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(8): 863-877 (2000)

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