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ORCID"A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay ..."
Swaroop Ghosh et al. (2006)
- Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury, Kaushik Roy:
A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay Sensor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(12): 2934-2943 (2006)
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