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"RESIST: a recursive test pattern generation algorithm for path delay ..."
Karl Fuchs, Michael Pabst, Torsten Rössel (1994)
- Karl Fuchs, Michael Pabst, Torsten Rössel:
RESIST: a recursive test pattern generation algorithm for path delay faults considering various test classes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(12): 1550-1562 (1994)
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