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"A probabilistic fault model for 'analog' faults in digital CMOS circuits."

Michele Favalli, Piero Olivo, Bruno Riccò (1992)

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DOI: 10.1109/43.177408

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/FavalliOR92
Michele Favalli, Piero Olivo, Bruno Riccò:
A probabilistic fault model for 'analog' faults in digital CMOS circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(11): 1459-1462 (1992)

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