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"Security Analysis of Industrial Test Compression Schemes."

Amitabh Das et al. (2013)

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DOI: 10.1109/TCAD.2013.2274619

access: closed

type: Journal Article

metadata version: 2023-08-28

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  - https://dblp.org/rec/journals/tcad/DasEGBV13
Amitabh Das, Baris Ege, Santosh Ghosh, Lejla Batina, Ingrid Verbauwhede:
Security Analysis of Industrial Test Compression Schemes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(12): 1966-1977 (2013)

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