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"Early Analysis of Critical Faults: An Approach to Test Generation From ..."

Sourasis Das, Ansuman Banerjee, Pallab Dasgupta (2012)

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DOI: 10.1109/TCAD.2011.2171183

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sourasis Das, Ansuman Banerjee, Pallab Dasgupta:
Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(3): 447-451 (2012)

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