"A Guaranteed Secure Scan Design Based on Test Data Obfuscation by ..."

Aijiao Cui et al. (2020)

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DOI: 10.1109/TCAD.2020.2979458

access: closed

type: Journal Article

metadata version: 2023-08-28

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Aijiao Cui, Mengyang Li, Gang Qu, Huawei Li:
A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4524-4536 (2020)

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