"Generating Test Patterns for Chiplet Interconnects With Optimized ..."

Po-Yao Chuang et al. (2025)

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DOI: 10.1109/TCAD.2024.3466809

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type: Journal Article

metadata version: 2025-03-07

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Po-Yao Chuang, Francesco Lorenzelli, Cheng-Wen Wu, Erik Jan Marinissen:
Generating Test Patterns for Chiplet Interconnects With Optimized Effectiveness and Efficiency. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(3): 1155-1168 (2025)

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