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"On reducing test application time for scan circuits using limited scan ..."

Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy (2005)

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DOI: 10.1109/TCAD.2005.852285

access: closed

type: Journal Article

metadata version: 2020-09-24

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Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy:
On reducing test application time for scan circuits using limited scan operations and transfer sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(10): 1594-1605 (2005)

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