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"Test Chips With Scan-Based Logic Arrays."

Yu-Hsiang Chen, Chia-Ming Hsu, Kuen-Jong Lee (2021)

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DOI: 10.1109/TCAD.2020.3010478

access: closed

type: Journal Article

metadata version: 2021-04-29

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Yu-Hsiang Chen, Chia-Ming Hsu, Kuen-Jong Lee:
Test Chips With Scan-Based Logic Arrays. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(4): 790-802 (2021)

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