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"Experimental evaluation of testability measures for test generation (logic ..."

Susheel J. Chandra, Janak H. Patel (1989)

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DOI: 10.1109/43.21822

access: closed

type: Journal Article

metadata version: 2020-09-24

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Susheel J. Chandra, Janak H. Patel:
Experimental evaluation of testability measures for test generation (logic circuits). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(1): 93-97 (1989)

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