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"TRIM: testability range by ignoring the memory."

Larry Carter, Leendert M. Huisman, Tom W. Williams (1988)

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DOI: 10.1109/43.3128

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/CarterHW88
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  - https://dblp.org/rec/journals/tcad/CarterHW88
Larry Carter, Leendert M. Huisman, Tom W. Williams:
TRIM: testability range by ignoring the memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(1): 38-49 (1988)

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