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"On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware ..."

Jan Burchard et al. (2018)

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DOI: 10.1109/TCAD.2017.2772825

access: closed

type: Journal Article

metadata version: 2023-03-21

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Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker:
On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2152-2165 (2018)

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