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"A new dynamic test vector compaction for automatic test pattern generation."

Bechir Ayari, Bozena Kaminska (1994)

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DOI: 10.1109/43.265676

access: closed

type: Journal Article

metadata version: 2020-09-24

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Bechir Ayari, Bozena Kaminska:
A new dynamic test vector compaction for automatic test pattern generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(3): 353-358 (1994)

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