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"Experimental Characterization of CMOS Interconnect Open Defects."

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras (2008)

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DOI: 10.1109/TCAD.2007.907255

access: closed

type: Journal Article

metadata version: 2020-09-24

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Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Experimental Characterization of CMOS Interconnect Open Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(1): 123-136 (2008)

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