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"Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out."

Daniel Arumí et al. (2011)

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DOI: 10.1109/TCAD.2011.2165071

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/ArumiMFEHK11
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  - https://dblp.org/rec/journals/tcad/ArumiMFEHK11
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1911-1922 (2011)

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