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"Time-Multiplexed 1687-Network for Test Cost Reduction."

Muhammad Adil Ansari et al. (2018)

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DOI: 10.1109/TCAD.2017.2766146

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/AnsariJKP18
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Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Time-Multiplexed 1687-Network for Test Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(8): 1681-1691 (2018)

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