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"Coverage Driven High-Level Test Generation Using a Polynomial Model of ..."

Bijan Alizadeh, Mohammad Mirzaei, Masahiro Fujita (2010)

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DOI: 10.1109/TCAD.2010.2043571

access: closed

type: Journal Article

metadata version: 2021-10-14

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Bijan Alizadeh, Mohammad Mirzaei, Masahiro Fujita:
Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(5): 737-748 (2010)

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