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"Local At-Speed Scan Enable Generation for Transition Fault Testing Using ..."

Nisar Ahmed et al. (2007)

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DOI: 10.1109/TCAD.2007.8361583

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/AhmedTRB07
Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler:
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5): 896-906 (2007)

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