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"Dynamic redundancy identification in automatic test generation."

Miron Abramovici, David T. Miller, Rabindra K. Roy (1992)

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DOI: 10.1109/43.124427

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/AbramoviciMR92
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  - https://dblp.org/rec/journals/tcad/AbramoviciMR92
Miron Abramovici, David T. Miller, Rabindra K. Roy:
Dynamic redundancy identification in automatic test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(3): 404-407 (1992)

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