Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Optimal Design and Sequential Analysis of VLSI Testing Strategy."

Philip S. Yu, C. Mani Krishna, Yann-Hang Lee (1988)

> Home

Details and statistics

DOI: 10.1109/12.2171

access: closed

type: Journal Article

metadata version: 2022-09-10

- view
  authority control:
- export record
  dblp key:
  - journals/tc/YuKL88
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/YuKL88
Philip S. Yu, C. Mani Krishna, Yann-Hang Lee:
Optimal Design and Sequential Analysis of VLSI Testing Strategy. IEEE Trans. Computers 37(3): 339-347 (1988)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.